Consulting

Are you planning to implement a new optical measuring process?

Then we are the right partner for the analysis of your requirements!

Duwe-3d AG can look back on an experience of more than 15 years in optical metrology and associated software. We are familiar with almost all optical processes in the field of 3d-data acquisition and we are working in close contact with several sensor manufacturers.
 

Particularities of optical data acquisition

Optical systems are being more and more used in the acquisition of data as a complement or a replacement of the traditional coordinate metrology. The advantages of this technology lie in the quick and mobile and contactless acquisition of surface points (3d-coordinates).

The scanned three-dimensional surface data can be used either in virtual or CAD modeling, or for the comparison with already available data. Optical sensors offer significant advantages with regard to conventional touch-probe coordinate measuring machines, particularly for the analysis of parts and components.

A particular attention must be paid to the following details, when optically acquiring data:

• The quality of the data depends of the optical properties of the scanned surface. Transparent or mirroring or black surfaces can be measured only with some restrictions
• The measuring process does not acquire specific points. The part surface will rather be scanned as 3d-coordinates (point cloud) in a pattern which depends of the sensor being used. As a result, some limitations can be found in the measurement of edges according to the point density and acquisition process (cross-sections and holes).
• It is much more difficult to describe the precision of an optical sensor than the one of a touch-probing device. An optical sensor is associated with a carrying system (for instance an articulated arm, a laser tracker, a coordinate measuring machine, etc.) or combined with photogrammetry. This influences significantly the precision which can really be achieved.

The particularities make the optical data acquisition to a quite complex process, which requires a precise analysis of the applicable requirements. Duwe-3d AG is able to advise you thereby with its know-how. Make our expertise a factor of your success!

Computer tomography: a real challenge

Today, the fast growing computer tomography (CT) processes also belong to the optical metrology. The challenge lies in the ability to compare the measuring results coming from CT processes or to determine the corresponding precision. Duwe-3d AG is a member of the working group VDI/VDE 3.33 for CT metrology, allowing us to gather a very significant experience and therefore to help you in the choice of the appropriate measuring processes.